Difference between revisions of "Integration Commands"

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(List of Integrated Commands)
(List of Integrated Commands)
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*Use: [[CTF補正#例1 Makefileを使ったCTF補正]]<br>
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*Use: [[Example 1 CTF-compensation using Makefile]]<br>
 
入力ファイルを作成して[[CTF補正]]を行う: ([[:Media:Makefile-CTFCorrection2.zip|Makefileのみ]]) ([https://sourceforge.jp/projects/eos/scm/git/tutorial/archive/master/CTFCorrection/CTFCorrection2/ 全ファイル])<br>
 
入力ファイルを作成して[[CTF補正]]を行う: ([[:Media:Makefile-CTFCorrection2.zip|Makefileのみ]]) ([https://sourceforge.jp/projects/eos/scm/git/tutorial/archive/master/CTFCorrection/CTFCorrection2/ 全ファイル])<br>
 
*Use 1: [[CTF補正#例2 Makefileを使ったCTF補正2]]<br>
 
*Use 1: [[CTF補正#例2 Makefileを使ったCTF補正2]]<br>

Revision as of 07:27, 15 July 2017

List of Integrated Commands

Here, we show the list of Integrated Commands provided in Eos. Currently, most of them is written by Makefile or bash. We will provide those written by PIONE in the near future.

Image Correction

CTF Correction

Apply CTF Correction to tiff files: (Makefile only ) (files)


入力ファイルを作成してCTF補正を行う: (Makefileのみ) (全ファイル)

同一視野でデフォーカス毎のCTF補正画像を比較する: (Makefileのみ) (全ファイル)
上記のコマンドには右記のコマンドも必要です。 (Makefileのみ) (全ファイル)

同一視野でデフォーカスの異なる入力ファイルを2つ作成してCTF補正を行う: (Makefileのみ) (全ファイル)



Single particle analysis

Classification of 2D images (Cluster analysis) and getting of average image

Estimation of projection angle using reference

Helical Single particle analysis

Electron tomography

Electron tomography method by using multiple ROI files

Helical Symmetry analysis

3D Reconstruction by Helical Symmetry

2D Image Processing

3D Image Processing

Resolution analysis

FRET analysis

Modeling