Difference between revisions of "Integration Commands"

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(List of Integrated Commands)
(CTF Correction)
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===[[Image Correction]]===
 
===[[Image Correction]]===
 
====[[CTF Correction]]====
 
====[[CTF Correction]]====
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Main items described in the CTF Correction are the following:
 +
 
Apply [[CTF Correction]] to [[tiff]] files: ([[:Media:Makefile-CTFCorrection.zip|Makefile only ]]) ([https://sourceforge.jp/projects/eos/scm/git/tutorial/archive/master/CTFCorrection/CTFCorrection1/ all files])<br>
 
Apply [[CTF Correction]] to [[tiff]] files: ([[:Media:Makefile-CTFCorrection.zip|Makefile only ]]) ([https://sourceforge.jp/projects/eos/scm/git/tutorial/archive/master/CTFCorrection/CTFCorrection1/ all files])<br>
 
*Use: [[CTF Correction#Example 1 CTF-compensation using Makefile]]<br>
 
*Use: [[CTF Correction#Example 1 CTF-compensation using Makefile]]<br>
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*Use 2: [[CTF補正#例7 デフォーカスの異なる画像の平均化2]]<br>
 
*Use 2: [[CTF補正#例7 デフォーカスの異なる画像の平均化2]]<br>
 
<br>
 
<br>
 
  
 
===[[Single particle analysis]]===
 
===[[Single particle analysis]]===

Revision as of 11:51, 15 July 2017

List of Integrated Commands

Here, we show the list of Integrated Commands provided in Eos. Currently, most of them is written by Makefile or bash. We will provide those written by PIONE in the near future.

Image Correction

CTF Correction

Main items described in the CTF Correction are the following:

Apply CTF Correction to tiff files: (Makefile only ) (all files)

CTF Correction using an input file : (Makefile only) (all files)

同一視野でデフォーカス毎のCTF補正画像を比較する: (Makefileのみ) (全ファイル)
上記のコマンドには右記のコマンドも必要です。 (Makefileのみ) (全ファイル)

同一視野でデフォーカスの異なる入力ファイルを2つ作成してCTF補正を行う: (Makefileのみ) (全ファイル)


Single particle analysis

Classification of 2D images (Cluster analysis) and getting of average image

Estimation of projection angle using reference

Helical Single particle analysis

Electron tomography

Electron tomography method by using multiple ROI files

Helical Symmetry analysis

3D Reconstruction by Helical Symmetry

2D Image Processing

3D Image Processing

Resolution analysis

FRET analysis

Modeling